Evaluating transient-fault effects on traditional C-element's implementations - Archive ouverte HAL
Communication Dans Un Congrès Année : 2010

Evaluating transient-fault effects on traditional C-element's implementations

Résumé

The C-element is a fundamental component in asynchronous circuits and quite used in synchronous circuits to mitigate transient faults. This work evaluates the transient-fault effects on the traditional dynamic, conventional, weak feedback, and symmetric C-element's implementations. An evaluation methodology is developed by means of fault-injection simulations at transistor level. Unlike existing methods, the methodology in this work is able to deal with the C-element function's particularities. In addition, C-element cells in different transient-fault robust versions are designed by using techniques based on sizing and transistor insertion. Results in terms of delay, power consumption, area, and fault-transient robustness show the best C-element options for the design of more robust systems.
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Dates et versions

hal-00569056 , version 1 (24-02-2011)

Identifiants

Citer

Rodrigo Possamai Bastos, G. Sicard, Fernanda Lima Kastensmidt, Marc Renaudin, Ricardo Reis. Evaluating transient-fault effects on traditional C-element's implementations. 16th IEEE International On-Line Testing Symposium (IOLTS'10), Jul 2010, Corfu island, Greece. pp.35 - 40, ⟨10.1109/IOLTS.2010.5560237⟩. ⟨hal-00569056⟩

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