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Journal Articles Microwave and Optical Technology Letters Year : 2011

Continuous-wave scanning terahertz near-field microscope


A versatile cw measurement setup for terahertz near-field reflectometry is proposed. Propagation, coupling, and focusing of wire guided modes are used to achieve a λ/33 resolution while imaging a metal corner deposited on glass. The setup is source and detector independent owing to wave coupling and decoupling with differential phase plates.
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hal-00565014 , version 1 (05-05-2021)


Attribution - CC BY 4.0



Jean-Paul Guillet, Laurent Chusseau, R. Adam, T. Grosjean, A. Pénarier, et al.. Continuous-wave scanning terahertz near-field microscope. Microwave and Optical Technology Letters, 2011, 53 (3), pp.580-582. ⟨10.1002/mop.25754⟩. ⟨hal-00565014⟩
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