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Article Dans Une Revue Surface and Interface Analysis Année : 2010

Trap characterization in AlGaN/GaN HEMT by analyzing frequency dispersion in capacitance and conductance

L. Semra
  • Fonction : Auteur
A. Telia
  • Fonction : Auteur

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hal-00549910 , version 1 (23-12-2010)

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L. Semra, A. Telia, A. Soltani. Trap characterization in AlGaN/GaN HEMT by analyzing frequency dispersion in capacitance and conductance. Surface and Interface Analysis, 2010, 42, pp.799-802. ⟨10.1002/sia.3462⟩. ⟨hal-00549910⟩
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