Measuring the elasto(plastic) properties of an homogeneous/isotropic material is now usually available at the microscopic scale by using nanoindentation and AFM techniques. Some studies show the possibility to measure elastic properties of anisotropic materials, some approaches try to determine the elastic properties of multi-layered isotropic material at the nano or micrometer scale and local measurements by nanoindentation on wood have already shown that mechanical properties of each cell wall layer can be estimated if these layers are sufficiently thick. The goal here is to extend these techniques to the case of any type of cell-wall layer using reverse identification of the mechanical properties. Theses researchs first step focuses on measuring (some) elastic properties on reference materials like sulfur monocristal or polymers using differents AFM techniques.