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Article Dans Une Revue Journal of Applied Physics Année : 2010

Energy transfer mechanism and Auger effect in Er3+ coupled silicon nanoparticle samples

Résumé

We report a spectroscopic study about the energy transfer mechanism among silicon nanoparticles (Si-np), both amorphous and crystalline, and Er ions in a silicon dioxide matrix. From infrared spectroscopic analysis, we have determined that the physics of the transfer mechanism does not depend on the Si-np nature, finding a fast (く200 ns) energy transfer in both cases, while the amorphous nanoclusters reveal a larger transfer efficiency than the nanocrystals. Moreover, the detailed spectroscopic results in the visible range here reported are essential to understand the physics behind the sensitization effect, whose knowledge assumes a crucial role to enhance the transfer rate and possibly employing the material in optical amplifier devices. Joining the experimental data, performed with pulsed and continuous-wave excitation, we develop a model in which the internal intraband recombination within Si-np is competitive with the transfer process via an Auger electron-“recycling” effect. Posing a different light on some detrimental mechanism such as Auger processes, our findings clearly recast the role of Si-np in the sensitization scheme, where they are able to excite very efficiently ions in close proximity to their surface.

Dates et versions

hal-00522531 , version 1 (30-09-2010)

Identifiants

Citer

A. Pitanti, D. Navarro-Urrios, N. Prtljaga, N. Daldosso, Fabrice Gourbilleau, et al.. Energy transfer mechanism and Auger effect in Er3+ coupled silicon nanoparticle samples. Journal of Applied Physics, 2010, 108, pp.053518. ⟨10.1063/1.3476286⟩. ⟨hal-00522531⟩
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