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Article Dans Une Revue IEEE Transactions on Instrumentation and Measurement Année : 2005

Narrow band frequency analysis for laser-based glass thickness measurement

François Cabestaing
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Jack-Gérard Postaire
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Ruo-Dan Zhang
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Résumé

This paper presents a narrow-band frequency analysis approach for a new laser interferometric heterodyne system, which is used for noncontact glass bottle wall thickness measurement. The measurement signal consists of a number of spectral components, the strongest of which is a reliable representation of the above-mentioned thickness. A fast method for searching and locating this frequency is vital for real-time implementations. As the standard fast Fourier transform (FFT) proved to be ineffective for the given problem, we use a combination of a zero-padding discrete Fourier transform (DFT) with a coarse-to-fine technique to locate this frequency at a smaller processing cost. Considering also the Chirp-z transform, a comparison of the different methods under investigation demonstrates the effectiveness of the proposed approach for online thickness estimation.
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Dates et versions

hal-00521079 , version 1 (25-09-2010)

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Bing He, François Cabestaing, Jack-Gérard Postaire, Ruo-Dan Zhang. Narrow band frequency analysis for laser-based glass thickness measurement. IEEE Transactions on Instrumentation and Measurement, 2005, 54 (1), pp.222-227. ⟨10.1109/TIM.2004.838911⟩. ⟨hal-00521079⟩
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