New features in the Raman spectrum of Silica: Key-points in the improvement on structure knowledge
Résumé
This paper reports the evidence of new signatures in the low-frequency Raman spectrum of sili-ca, obtained by very high signal-to-noise experiments. Two new Raman lines are observed at 295 and 380 cm-1, and the presence of a third one at 245 cm-1 is needed to account for the experimental spectra. The origin of these supplementary lines is discussed in terms of n-membered rings of [SiO4/2] tetrahedral entities inside the glassy network.
Domaines
Matériaux| Origine | Fichiers produits par l'(les) auteur(s) |
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