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Article Dans Une Revue Microelectronics Reliability Année : 2010

Fracture phenomena induced by Front-End/Back-End interactions: Dedicated failure analysis and numerical developments

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hal-00514516 , version 1 (02-09-2010)

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  • HAL Id : hal-00514516 , version 1

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S. Gallois-Garreignot, Vincent Fiori, Daniel Nelias. Fracture phenomena induced by Front-End/Back-End interactions: Dedicated failure analysis and numerical developments. Microelectronics Reliability, 2010, 50 (1), pp.75-85. ⟨hal-00514516⟩
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