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Article Dans Une Revue Solid State Ionics Année : 2010

High resolution electrical characterisation of Ag-conducting heterogeneous chalcogenide glasses

Résumé

Electric force microscopy (EFM) and conductive atomic force microcopy (C-AFM) are introduced to perform nanoscale electrical characterization of phase separated Agx(Ge0.25Se0.75)100−x glasses. Changes in the relative permittivity are found for both phases when the silver content is changed. Furthermore, the sensitivity of the C-AFM technique revealed current variations of a few pico-amperes in the Ag-rich phase for the different glass compositions. This result confirms that the increase in conductivity of the Ag–Ge–Se samples in the region of high ionic conduction (xN8–10 at.%) arises from an increase in conductivity of the Ag-rich phase and not from an increase in amount of Ag-rich phase with a fixed composition and conductivity.

Dates et versions

hal-00511009 , version 1 (23-08-2010)

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Andrea Piarristeguy, Michel Ramonda, Nathalie Nf Frolet, Michel Mr Ribes, Annie Ap Pradel. High resolution electrical characterisation of Ag-conducting heterogeneous chalcogenide glasses. Solid State Ionics, 2010, 181, pp.1205-1208. ⟨10.1016/j.ssi.2010.06.050⟩. ⟨hal-00511009⟩
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