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Article Dans Une Revue Microelectronics Reliability Année : 2009

Multilevel behavioural modelling for reliability analysis of ionizing dose effects on a n-MOS simple current mirror

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hal-00499470 , version 1 (09-07-2010)

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Corinne Bestory, François Marc, Sophie Duzellier, Hervé Lévi. Multilevel behavioural modelling for reliability analysis of ionizing dose effects on a n-MOS simple current mirror. Microelectronics Reliability, 2009, 49, pp.946-951. ⟨10.1016/j.microrel.2009.07.025⟩. ⟨hal-00499470⟩
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