A multi-model X-FEM strategy dedicated to frictional crack growth under cyclic fretting fatigue loadings. - Archive ouverte HAL
Article Dans Une Revue International Journal of Solids and Structures Année : 2010

A multi-model X-FEM strategy dedicated to frictional crack growth under cyclic fretting fatigue loadings.

Résumé

A 2D X-FEM/LATIN numerical model (eXtended Finite Element Method/Large Time Increment method) is proposed in this paper for the analysis of fretting fatigue problems and the simulation of the crack propagation under such loadings. The half-analytical two-body contact analysis allows to capture accurately the pressure and the cyclic tractions exerted at the interface that induce non-proportional multi-axial loading. These distributions are then used as input data for determining critical location for crack initiation and crack inclination based on Dang Van's criterion. The frictional contact conditions of the fretting fatigue cracks have an important impact on the crack behaviour. In this respect, contact with friction between the crack faces is finely modeled within the X-FEM frame. The obtained results are compared and validated with a half-analytical reference model. The numerical simulations reveal the robustness and the efficiency of the proposed approach for a wide range of fretting loadings and friction coefficients values along crack faces. The crack growth directions are then predicted accurately based on the use of criteria adapted to multi-axial non-proportional fatigue. Four cases dealing with crack propagation are then presented. It is shown how the crack length, the tangential loading modify the crack path during the propagation process.
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Dates et versions

hal-00481987 , version 1 (15-01-2019)

Identifiants

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Marie-Christine Baietto, Emilien Pierres, Anthony Gravouil. A multi-model X-FEM strategy dedicated to frictional crack growth under cyclic fretting fatigue loadings.. International Journal of Solids and Structures, 2010, 47 (10), pp.1405-1423. ⟨10.1016/j.ijsolstr.2010.02.003⟩. ⟨hal-00481987⟩
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