Topography and work function measurements of thin MgO(001) films on Ag(001) by nc-AFM and KPFM

M. Bielezki; T. Soini; M. Pivetta; C.R. Henry; A.S. Foster; F. Esch; C. Barth; U. Heiz

Journal Articles Physical Chemistry Chemical Physics Year : 2010

Topography and work function measurements of thin MgO(001) films on Ag(001) by nc-AFM and KPFM

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M. Bielezki

Function : Author

T. Soini

Function : Author

M. Pivetta

Function : Author

C.R. Henry

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Centre Interdisciplinaire de Nanoscience de Marseille

A.S. Foster

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F. Esch

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C. Barth

Function : Author
PersonId : 169693
IdHAL : clemens-barth
ORCID : 0000-0003-4250-4533
IdRef : 196747473

Centre Interdisciplinaire de Nanoscience de Marseille

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U. Heiz

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Submitted on : Monday, April 26, 2010-4:08:01 PM

Last modification on : Friday, March 24, 2023-2:52:53 PM

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hal-00476532 , version 1 (26-04-2010)

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M. Bielezki, T. Soini, M. Pivetta, C.R. Henry, A.S. Foster, et al.. Topography and work function measurements of thin MgO(001) films on Ag(001) by nc-AFM and KPFM. Physical Chemistry Chemical Physics, 2010, 12 (13), pp.3203-3209. ⟨hal-00476532⟩

Topography and work function measurements of thin MgO(001) films on Ag(001) by nc-AFM and KPFM

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