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Journal Articles Advanced Engineering Materials Year : 2001

On the application of x-ray microtomography in the field of materials science

L. Salvo
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J.J. Blandin
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Abstract

The principle of the tomography technique and the different possible set-ups, which can be used to obtain medium-(10 μm) and high-(1 μm) resolution, three-dimensional, non-destructive images, are shown in this paper. Illustrations are made of the applications of the technique in the field of materials science. Examples are given for medium-resolution images of metallic foams and model metal matrix composites that are reinforced with spherical particles. High-resolution examples are shown for aluminium alloys. For low-absorbent materials we show that the phase contrast obtained using synchrotron radiation can provide a valuable solution. The quantitative use of these images, coupled with in-situ tensile tests or used for the simple analysis of the initial microstructure of several structural materials, is also described.
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Dates and versions

hal-00475297 , version 1 (25-01-2022)

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Attribution - NonCommercial - CC BY 4.0

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Eric Maire, Jean-Yves Buffiere, L. Salvo, J.J. Blandin, Wolfgang Ludwig, et al.. On the application of x-ray microtomography in the field of materials science. Advanced Engineering Materials, 2001, pp.539-546. ⟨10.1002/1527-2648(200108)3:8<539::AID-ADEM539>3.0.CO;2-6⟩. ⟨hal-00475297⟩
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