Effect of depth etching on Bragg reflectors realized by focused ion beam in Ti:LiNbO3 waveguide
Résumé
In this paper we have studied effect of depth etching on the Bragg gratings (BGs) realized by Focused Ions Beam. This technique has the advantage to induce a direct waveguide structuring without intermediate media, comparing to traditional methods. A reflectivity of 96% within a window centred at 1550 nm is obtained. The effect of the depth etching on the transmittance and the bandwidth at half maximum is demonstrated.
Domaines
Optique / photonique| Origine | Fichiers produits par l'(les) auteur(s) |
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