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Article Dans Une Revue Plasma Processes and Polymers Année : 2009

Thermal stability of TaN-based thin layers for Cu metallization

Résumé

The diffusion of Cu through TaN‐based thin layers into a Si substrate has been studied. The barrier efficiency of TaN/Ta/TaN multilayer barrier of 50 nm:50 nm:50 nm in thickness has been investigated and is compared with that of TaN single layers. Thermal stabilities of these TaN‐based thin layers were determined from glancing incidence angle X‐ray diffraction and transmission electron microscopy, conducted in the temperature range of 773–973 K. The TaN/Ta/TaN barrier appeared to be more efficient than the TaN single layer in preventing Cu diffusion.

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Matériaux
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Dates et versions

hal-00461202 , version 1 (11-07-2018)

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Julien Nazon, Marie-Hélène Berger, Joël Sarradin, Jean-Claude Tedenac, Nicole Fréty. Thermal stability of TaN-based thin layers for Cu metallization. Plasma Processes and Polymers, 2009, 6 (S1), pp.S844-S848. ⟨10.1002/ppap.200932107⟩. ⟨hal-00461202⟩
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