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Communication Dans Un Congrès Année : 2002

Critical comparison of recent analysis methods of X-ray and neutron reflectivity data

Arie van Der Lee

Résumé

New analysis methods for X-ray and neutron reflectivity data are compared. All methods aim to deduce a general density profile across a thin film from experimental observations. Although more powerful than traditional least-squares fitting methods, they do not give in general a unique profile either. Two synthetical and two experimental examples are given to demonstrate the usefulness of the methods. Some guidelines are given for their use.
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Dates et versions

hal-00451859 , version 1 (01-02-2010)

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  • HAL Id : hal-00451859 , version 1

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Arie van Der Lee. Critical comparison of recent analysis methods of X-ray and neutron reflectivity data. X-Ray and Matter Conference (RX 2001), Dec 2001, STRASBOURG (FRANCE), France. pp.255-263. ⟨hal-00451859⟩
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