Near-field spectroscopy of low-loss waveguide integrated microcavities
Résumé
A scanning near-field spectroscopy method is used to observe loss reduction and Q-factor enhancement due to transverse-mode profile matching within photonic-crystal microcavities. Near-field measurements performed directly on cavity modes are compared with three-dimensional calculations and quantitative agreement is observed. (c) 2006 American Institute of Physics.
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