High-precision x-ray spectroscopy in few-electron ions
Résumé
The experimental and spectrum analysis procedures that led to about 15 new, high-precision, relative x-ray line energy measurements are presented. The measured lines may be used as x-ray reference lines in the 2.4-3.1 keV range. Applications also include tests of the atomic theory, and in particular of quantum electrodynamics and of relativistic many-body theory calculations. The lines originate from 2- to 4-electron ions of sulfur (Z=16), chlorine (Z=17) and argon (Z=18). The precision reached for their energy ranges from a few parts per million (ppm) to about 50 ppm. This places the new measurements among the most precise performed in mid-Z highly charged ions (Z is the nuclear charge number). The elements of the experimental setup are described: the ion source (an electron cyclotron resonance ion trap), the spectrometer (a single, spherically bent crystal spectrometer), as well as the spectrum acquisition camera (low-noise, high-efficiency CCD). The spectrum analysis procedure, which is based on a full simulation of the spectrometer response function, is also presented.