X-ray spectroscopy characterization of Ar$^{17+}$ produced by an ECRIS in the afterglow mode
Résumé
An electron–cyclotron–resonance ion source (ECRIS) operating in the afterglow mode allows to produce pulsed highly charged ion beams. We present a characterization of the first production of pulsed Ar17+ ions from an ECRIS using X-ray spectroscopy techniques. An ion current increase of a factor 3-4 compared to the continuous operating mode with a short rise time (< 100 µs) and a full width at half maximum of 500 µs has been obtained.
Domaines
Physique Atomique [physics.atom-ph]| Origine | Fichiers produits par l'(les) auteur(s) |
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