Thermal conductivity of semiconductor superlattices: Experimental study of interface scattering - Archive ouverte HAL
Article Dans Une Revue Physical Review B: Condensed Matter and Materials Physics (1998-2015) Année : 2009

Thermal conductivity of semiconductor superlattices: Experimental study of interface scattering

Résumé

We present thermal conductivity measurements performed in three short-period (GaAs)_9(AlAs)_5 superlattices. The samples were grown at different temperatures, leading to different small scale roughness and broadening of the interfaces. The cross-plane conductivity is measured with a differential 3w method, at room temperature. The order of magnitude of the overall thermal conductivity variation is consistent with existing theoretical models, although the actual variation is smaller than expected.
Fichier principal
Vignette du fichier
sr_v2_HAL.pdf (122.71 Ko) Télécharger le fichier
Origine Fichiers produits par l'(les) auteur(s)

Dates et versions

hal-00422390 , version 1 (07-10-2009)

Identifiants

Citer

Jean Yves Duquesne. Thermal conductivity of semiconductor superlattices: Experimental study of interface scattering. Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2009, 79 (15), pp.153304. ⟨10.1103/PhysRevB.79.153304⟩. ⟨hal-00422390⟩
84 Consultations
242 Téléchargements

Altmetric

Partager

More