Analysis of the dynamic behavior changes of supercapacitors during calendar life test under several voltages and temperatures conditions - Archive ouverte HAL
Article Dans Une Revue Microelectronics Reliability Année : 2009

Analysis of the dynamic behavior changes of supercapacitors during calendar life test under several voltages and temperatures conditions

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Energie électrique

Jean-Michel Vinassa  : Connectez-vous pour contacter le contributeur

https://hal.science/hal-00414775

Soumis le : mercredi 9 septembre 2009-23:32:04

Dernière modification le : mercredi 2 août 2023-16:40:25

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hal-00414775 , version 1 (09-09-2009)

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  • HAL Id : hal-00414775 , version 1

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Hassane El Brouji, Olivier Briat, Jean-Michel Vinassa, Hervé Henry, Eric Woirgard. Analysis of the dynamic behavior changes of supercapacitors during calendar life test under several voltages and temperatures conditions. Microelectronics Reliability, 2009, 49, pp. 1391-1397. ⟨hal-00414775⟩

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