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Communication Dans Un Congrès Année : 2009

Accurate ADC dynamic testing by means of the three-parameter sine-fit algorithm

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hal-00412251 , version 1 (01-09-2009)

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Daniel Belega, Dominique Dallet. Accurate ADC dynamic testing by means of the three-parameter sine-fit algorithm. International Mixed-Signals, Sensors, and Systems Test Workshop - IMS3TW '09, Jun 2009, scottsdale, United States. pp.1-6, ⟨10.1109/IMS3TW.2009.5158682⟩. ⟨hal-00412251⟩
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