Photoinduced phenomena in amorphous As4Se3 pulsed laser deposited thin films studied by spectroscopic ellipsometry
Résumé
Amorphous As4Se3 thin films were prepared by pulsed laser deposition technique. Variable angle spectroscopic ellipsometry was used for the study of reversible photoinduced phenomena in well-annealed films. Tauc-Lorentz and Cody-Lorentz models were employed for the analysis of ellipsometric data. Reversible photorefraction and photodarkening were identified by both models; however, Cody-Lorentz model is shown to be more appropriate for the description of amorphous chalcogenide thin films. The behavior of best fit Cody-Lorentz model parameters is discussed in detail.