Silicon phototransistor reliability assessment and new selection strategies for space applications - Archive ouverte HAL
Communication Dans Un Congrès Année : 2008
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hal-00402616 , version 1 (07-07-2009)

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  • HAL Id : hal-00402616 , version 1

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Piero Spezzigu, Laurent Bechou, Yannick Deshayes, Yves Ousten, Gianandrea Quadri, et al.. Silicon phototransistor reliability assessment and new selection strategies for space applications. SPIE EUROPHOTONICS CONFERENCE, Apr 2008, Strasbourg, France. pp. 70030O-1/70030O9. ⟨hal-00402616⟩
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