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Communication Dans Un Congrès Année : 2008

Failure analysis of advanced CMOS technology: some trends, state of the art and future challenges

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Electronique
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Dates et versions

hal-00401385 , version 1 (03-07-2009)

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  • HAL Id : hal-00401385 , version 1

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Philippe Perdu, Dean Lewis, V. Pouget. Failure analysis of advanced CMOS technology: some trends, state of the art and future challenges. European Symposium on Reliability of Electron Devices (ESREF), 2008, Maastricht, Netherlands. ⟨hal-00401385⟩
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