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https://hal.science/hal-00401385
Submitted on : Friday, July 3, 2009-7:56:05 AM
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- HAL Id : hal-00401385 , version 1
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Philippe Perdu, Dean Lewis, V. Pouget. Failure analysis of advanced CMOS technology: some trends, state of the art and future challenges. European Symposium on Reliability of Electron Devices (ESREF), 2008, Maastricht, Netherlands. ⟨hal-00401385⟩
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