Fundamentals of the Pulsed Laser Technique for single-event upset testing - Archive ouverte HAL Access content directly
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hal-00401314 , version 1 (02-07-2009)

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  • HAL Id : hal-00401314 , version 1

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Pascal Fouillat, Vincent Pouget, D. Mcmorrow, Frédéric Darracq, S. Buchner, et al.. Fundamentals of the Pulsed Laser Technique for single-event upset testing. School on the Effects of Radiation on Embedded Systems for Space Application (SERESSA), 2005, Manaus, Brazil. ⟨hal-00401314⟩
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