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Communication Dans Un Congrès Année : 2009

Investigation of High Frequency coupling between Probe tips and Wafer surface.

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hal-00400373 , version 1 (30-06-2009)

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  • HAL Id : hal-00400373 , version 1

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J. Bazzi, C. Raya, A. Curutchet, T. Zimmer. Investigation of High Frequency coupling between Probe tips and Wafer surface.. IEEE BiCMOS Technology Meeting 2009, Oct 2009, Italy. pp.__. ⟨hal-00400373⟩
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