Extended topological sensitivity for defect identification - Archive ouverte HAL
Communication Dans Un Congrès Année : 2009

Extended topological sensitivity for defect identification

Marc Bonnet
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Dates et versions

hal-00399716 , version 1 (29-06-2009)

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  • HAL Id : hal-00399716 , version 1

Citer

Marc Bonnet. Extended topological sensitivity for defect identification. ECCOMAS International Symposium on Inverse Problems in Mechanics of Structures and Materials in Mechanics, Apr 2009, Rzeszow, Poland. ⟨hal-00399716⟩
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