Conference Papers
Year : 2008
Frédéric Darracq : Connect in order to contact the contributor
https://hal.science/hal-00398000
Submitted on : Wednesday, June 24, 2009-8:59:33 AM
Last modification on : Friday, March 24, 2023-2:52:52 PM
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- HAL Id : hal-00398000 , version 1
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A. Machouat, G. Haller, V. Goubier, Dean Lewis, Vincent Pouget, et al.. Scan-based ATPG diagnostic and optical techniques combination: A new approach to improve accuracy of defect isolation in functional logic failure. 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Jul 2008, Singapour, Singapore. pp.1-5. ⟨hal-00398000⟩
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