Scan-based ATPG diagnostic and optical techniques combination: A new approach to improve accuracy of defect isolation in functional logic failure - Archive ouverte HAL Access content directly
Conference Papers Year : 2008
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hal-00398000 , version 1 (24-06-2009)

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  • HAL Id : hal-00398000 , version 1

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A. Machouat, G. Haller, V. Goubier, Dean Lewis, Vincent Pouget, et al.. Scan-based ATPG diagnostic and optical techniques combination: A new approach to improve accuracy of defect isolation in functional logic failure. 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Jul 2008, Singapour, Singapore. pp.1-5. ⟨hal-00398000⟩
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