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Conference Papers Year : 2007

Highlights of Laser Testing Capabilities Regarding the Understanding of SEE in SRAM-based FPGA

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Electronics
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hal-00397854 , version 1 (23-06-2009)

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  • HAL Id : hal-00397854 , version 1

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A. Bocquillon, G. Foucard, F. Miller, Nadine Buard, Régis Leveugle, et al.. Highlights of Laser Testing Capabilities Regarding the Understanding of SEE in SRAM-based FPGA. 9th European Conference on Radiation and its Effects on Components and Systems (RADECS), Sep 2007, Deauville, France. pp.36-42. ⟨hal-00397854⟩
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