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Article Dans Une Revue IEEE Transactions on Nuclear Science Année : 2008

Study of Single Event Transients in High-Speed Operational Amplifiers

Résumé

This paper presents a simulation and experimental study of the analog single-event transient sensitivity of wide bandwidth operational amplifiers. Architecture effects are presented that could influence ASIC design and COTS selection.

Domaines

Electronique
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Dates et versions

hal-00397747 , version 1 (23-06-2009)

Identifiants

  • HAL Id : hal-00397747 , version 1

Citer

Patrice Jaulent, Vincent Pouget, Dean Lewis, Pascal Fouillat. Study of Single Event Transients in High-Speed Operational Amplifiers. IEEE Transactions on Nuclear Science, 2008, 55 (4), pp.1974-1981. ⟨hal-00397747⟩
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