Electrical Modeling for Laser Testing with Different Pulse Durations - Archive ouverte HAL Access content directly
Conference Papers Year : 2005
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hal-00397739 , version 1 (23-06-2009)

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  • HAL Id : hal-00397739 , version 1

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Alexandre Douin, Vincent Pouget, Dean Lewis, Pascal Fouillat, Phillipe Perdu. Electrical Modeling for Laser Testing with Different Pulse Durations. 11th IEEE International On Line Testing Symposium, Jul 2005, Saint Raphael, France. pp.9-13. ⟨hal-00397739⟩
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