Characterization of silicon mesoporous by scanning thermal microscopy - Archive ouverte HAL
Communication Dans Un Congrès Année : 2006

Characterization of silicon mesoporous by scanning thermal microscopy

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Dates et versions

hal-00357448 , version 1 (30-01-2009)

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  • HAL Id : hal-00357448 , version 1

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S. Gomes, M. Raynaud. Characterization of silicon mesoporous by scanning thermal microscopy. 5th International Conference Porous Semiconductors-Science and Technology, Mar 2006, Sitges, Spain. ⟨hal-00357448⟩
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