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Article Dans Une Revue Microelectronics Reliability Année : 2008

Comparison between changes of ultracapacitors model parameters during calendar life and power cycling ageing tests

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hal-00333031 , version 1 (22-10-2008)

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  • HAL Id : hal-00333031 , version 1

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Hassane El Brouji, Olivier Briat, Jean-Michel Vinassa, Nicolas Bertrand, Eric Woirgard. Comparison between changes of ultracapacitors model parameters during calendar life and power cycling ageing tests. Microelectronics Reliability, 2008, 48 (9), pp. 1473-1478. ⟨hal-00333031⟩
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