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Article Dans Une Revue Microelectronics Reliability Année : 2007

Statistical analysis during the reliability simulation

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hal-00326542 , version 1 (03-10-2008)

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Corinne Bestory, François Marc, Hervé Lévi. Statistical analysis during the reliability simulation. Microelectronics Reliability, 2007, 47, pp.1353-1357. ⟨10.1016/j.microrel.2007.07.079⟩. ⟨hal-00326542⟩
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