Scanning electron microscopy and transmission electron microscopy <i>in situ</i> studies of grain boundary migration in cold-deformed aluminium bicrystals - Archive ouverte HAL
Article Dans Une Revue Journal of Microscopy Année : 2006

Scanning electron microscopy and transmission electron microscopy in situ studies of grain boundary migration in cold-deformed aluminium bicrystals

Résumé

The crystallography of recrystallization has been investigated in channel-die deformed pure aluminium bicrystals with {100}<011>/{110}<001> orientations. The microstructural and microtextural changes during the early stages of recrystallization were followed by systematic local orientation measurements using scanning and transmission electron microscopes. In particular, orientation mapping combined with in situ sample heating was used to investigate the formation and growth of new grains at very early stages of recrystallization. Grain boundary migration and 'consumption' of the as-deformed areas was always favoured along directions parallel to the traces of the {111} slip planes that had been most active during deformation.

Domaines

Matériaux
Fichier non déposé

Dates et versions

hal-00293135 , version 1 (03-07-2008)

Identifiants

Citer

Henryk Paul, Julian H. Driver, Jerzy Morgiel, Arnaud Lens, Adam Bydałek, et al.. Scanning electron microscopy and transmission electron microscopy in situ studies of grain boundary migration in cold-deformed aluminium bicrystals. Journal of Microscopy, 2006, 223 (3), pp.264-267. ⟨10.1111/j.1365-2818.2006.01641.x⟩. ⟨hal-00293135⟩
58 Consultations
0 Téléchargements

Altmetric

Partager

More