Surface characterization of sol-gel derived scintillating rare-earth doped Lu2SiO5 thin films - Archive ouverte HAL
Article Dans Une Revue Journal of Physics: Conference Series Année : 2008

Surface characterization of sol-gel derived scintillating rare-earth doped Lu2SiO5 thin films

Résumé

Rare earth doped Lu2SiO5 thin films have been prepared by combining sol-gel process and spin coating. Annealing treatment results in the crystallization of the film and efficient incorporation of rare earth doping ions. XPS and RBS spectrocopies showed that the composition of the films is close to the nominal one. Adventitious carbon has been observed and attributed to incomplete pyrolysis of metal-organic precursors. XPS concentrations profiles show a good homogeneity for the films. RBS demonstrated some inter-diffusion between amorphous carbon substrate and silicate films resulting in a gradient of carbon at the interface between the substrate and the film itself.

Domaines

Matériaux
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Dates et versions

hal-00291619 , version 1 (27-06-2008)

Identifiants

Citer

Christelle Mansuy, Eric Tomasella, Rachid Mahiou, Jean Grimblot, Jean-Marie Nedelec. Surface characterization of sol-gel derived scintillating rare-earth doped Lu2SiO5 thin films. Journal of Physics: Conference Series, 2008, 100, pp.012037. ⟨10.1088/1742-6596/100/1/012037⟩. ⟨hal-00291619⟩
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