Electronic transport through alkylthiol monolayers under mechanical stress measured by Conducting-AFM - Archive ouverte HAL Access content directly
Conference Papers Year : 2007

Electronic transport through alkylthiol monolayers under mechanical stress measured by Conducting-AFM

S. Lenfant
D. Deresmes
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hal-00285224 , version 1 (05-06-2008)

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  • HAL Id : hal-00285224 , version 1

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S. Lenfant, D. Deresmes, D. Vuillaume. Electronic transport through alkylthiol monolayers under mechanical stress measured by Conducting-AFM. European Materials Research Society Spring Meeting, Symposium K : Nanoscale self-assembly and patterning, 2007, Strasbourg, France. ⟨hal-00285224⟩
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