Characterization of electromagnetic leakages throughout the connector shell - Archive ouverte HAL Accéder directement au contenu
Communication Dans Un Congrès Année : 2007

Characterization of electromagnetic leakages throughout the connector shell

Résumé

The paper deals with methodology to analyze electromagnetic (EM) leakages from connectors shielding due to the presence of apertures and slots. Some experimental and numerical results will be proposed to evaluate the electromagnetic coupling between connector apertures and a PCB trace line in terms of current and voltage induced on the line.
Fichier non déposé

Dates et versions

hal-00284438 , version 1 (03-06-2008)

Identifiants

Citer

Youssef Bouri, Lamine Kone, Jean Razafiarivelo, David Baudry, S. Baranowski, et al.. Characterization of electromagnetic leakages throughout the connector shell. 11th IEEE Workshop on Signal Propagation on Interconnects, SPI 2007, May 2007, Ruta di Camogli, Italy. pp.109-112, ⟨10.1109/SPI.2007.4512224⟩. ⟨hal-00284438⟩
23 Consultations
0 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More