Stereological characterization of the γ' particles in a nickel base superalloy: Comparison between transmission electron microscopy and atomic force microscopy techniques - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Materials Characterization Année : 2008

Stereological characterization of the γ' particles in a nickel base superalloy: Comparison between transmission electron microscopy and atomic force microscopy techniques

Résumé

Critical comparison of transmission electron microscopy and atomic force microscopy techniques was provided concerning size measurements of γ' precipitates in a nickel-base superalloy. The divergence between results is explained in terms of the resolution limit for atomic force microscopy, linked both to the tip dimension and the diameter of the investigated particles.

Dates et versions

hal-00264486 , version 1 (17-03-2008)

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Marion Risbet, X. Feaugas, C. Guillemer-Neel, Michel Clavel. Stereological characterization of the γ' particles in a nickel base superalloy: Comparison between transmission electron microscopy and atomic force microscopy techniques. Materials Characterization, 2008, 59 (9), pp.In Press. ⟨10.1016/j.matchar.2007.10.006⟩. ⟨hal-00264486⟩
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