The expansion of Wireless Systems-on-Chip leads to a rapid development of design and manufacturing methods. In this paper, the test vectors used for design validation of AMS & RF SoCs are evaluated and optimized. This qualification is based on a fault injection method. A fault model based on variation of behavioral parameters and a related qualification metric are proposed. This approach is used in the receiver's design of a WCDMA transceiver. A test set defined by verification engineers during the validation of this system is qualified and optimized. Then, this test set is compared with a second test set automatically generated by a developed tool. Keys words: Test Qualification, characterization, design validation, AMS & RF SoCs, VHDL-AMS, behavioral modeling, fault injection.