Article Dans Une Revue Journal of Applied Physics Année : 2008

X-ray photoelectron emission microscopy in combination with x-ray magnetic circular dichroism investigation of size effects on field-induced Néel-cap reversal

Résumé

X-ray photoelectron emission microscopy in combination with x-ray magnetic circular dichroism is used to investigate the influence of an applied magnetic field on Néel caps (i.e., surface terminations of asymmetric Bloch walls). Self-assembled micron-sized Fe(110) dots displaying a moderate distribution of size and aspect ratios serve as model objects. Investigations of remanent states after application of an applied field along the direction of Néel-cap magnetization give clear evidence for the magnetization reversal of the Néel caps around 120 mT, with a ±20 mT dispersion. No clear correlation could be found between the value of the reversal field and geometrical features of the dots.

Fichier principal
Vignette du fichier
JAP_Neel_cap.pdf (897.29 Ko) Télécharger le fichier
Origine Fichiers produits par l'(les) auteur(s)
Licence
Loading...

Dates et versions

hal-00243082 , version 1 (06-02-2008)

Licence

Identifiants

Citer

Fabien Cheynis, N. Rougemaille, Rachid Belkhou, Jean-Christophe Toussaint, Olivier Fruchart. X-ray photoelectron emission microscopy in combination with x-ray magnetic circular dichroism investigation of size effects on field-induced Néel-cap reversal. Journal of Applied Physics, 2008, 103, pp.07D915. ⟨10.1063/1.2832332⟩. ⟨hal-00243082⟩
530 Consultations
199 Téléchargements

Altmetric

Partager

  • More