X-ray photoelectron emission microscopy in combination with x-ray magnetic circular dichroism investigation of size effects on field-induced Néel-cap reversal - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Journal of Applied Physics Année : 2008

X-ray photoelectron emission microscopy in combination with x-ray magnetic circular dichroism investigation of size effects on field-induced Néel-cap reversal

Fabien Cheynis
Nicolas Rougemaille
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Jean-Christophe Toussaint
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Olivier Fruchart

Résumé

X-ray photoelectron emission microscopy in combination with x-ray magnetic circular dichroism is used to investigate the influence of an applied magnetic field on Néel caps (i.e., surface terminations of asymmetric Bloch walls). Self-assembled micron-sized Fe(110) dots displaying a moderate distribution of size and aspect ratios serve as model objects. Investigations of remanent states after application of an applied field along the direction of Néel-cap magnetization give clear evidence for the magnetization reversal of the Néel caps around 120 mT, with a ±20 mT dispersion. No clear correlation could be found between the value of the reversal field and geometrical features of the dots.
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Dates et versions

hal-00243082 , version 1 (06-02-2008)

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Fabien Cheynis, Nicolas Rougemaille, Rachid Belkhou, Jean-Christophe Toussaint, Olivier Fruchart. X-ray photoelectron emission microscopy in combination with x-ray magnetic circular dichroism investigation of size effects on field-induced Néel-cap reversal. Journal of Applied Physics, 2008, 103, pp.07D915. ⟨10.1063/1.2832332⟩. ⟨hal-00243082⟩
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