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Article Dans Une Revue Microelectronics Reliability Année : 2006

Application of various optical techniques for ESD defect localization

Résumé

Various optical defect localization techniques are applied on the same integrated circuits (IC). These circuits were previously stressed by Electro Static Discharges (ESD) to create defects. The results obtained by each technique were analyzed to determine the nature of the defects. The different data are compared to assess their sensitivity and to evaluate the contribution of each technique in a failure analysis flow

Domaines

Electronique

Dates et versions

hal-00204570 , version 1 (15-01-2008)

Identifiants

Citer

Fabien Essely, Frédéric Darracq, Vincent Pouget, Mustapha Remmach, Félix Beaudoin, et al.. Application of various optical techniques for ESD defect localization. Microelectronics Reliability, 2006, 46 (9-11), pp.1563-1568, 10.1016/j.microrel.2006.07.021. ⟨10.1016/j.microrel.2006.07.021⟩. ⟨hal-00204570⟩
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