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Communication Dans Un Congrès Année : 2007

Two dimensional numerical simulation of 1/f noise by GR mechanisms in thin film transistors : Effects of induced defect technology

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Electronique
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Dates et versions

hal-00197402 , version 1 (14-12-2007)

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  • HAL Id : hal-00197402 , version 1

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Christophe Cordier, Abdelmalek Boukhenoufa, Laurent Pichon. Two dimensional numerical simulation of 1/f noise by GR mechanisms in thin film transistors : Effects of induced defect technology. Europeen Symposium Reliability on Electron Devices, 2007, Arcachon, France. ⟨hal-00197402⟩
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