Polarized micro-Raman spectroscopy for studying stresses in as-grown and tensile-tested diamond films - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Surface and Coatings Technology Année : 2008

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hal-00194734 , version 1 (07-12-2007)

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T. Gries, L. Vandenbulcke, Patrick Simon, A. Canizares. Polarized micro-Raman spectroscopy for studying stresses in as-grown and tensile-tested diamond films. Surface and Coatings Technology, 2008, 202, pp.2263-2267. ⟨10.1016/j.surfcoat.2007.08.050⟩. ⟨hal-00194734⟩
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