Study of 3C-SiC nucleation on (0 0 0 1) 6H-SiC nominal surfaces by the CF-PVT method - Archive ouverte HAL
Article Dans Une Revue Journal of Crystal Growth Année : 2005

Study of 3C-SiC nucleation on (0 0 0 1) 6H-SiC nominal surfaces by the CF-PVT method

Résumé

3C-SiC nucleation on (0 0 0 1) 6H-SiC nominal surfaces was investigated during the heating-up step of the continuous feed-physical vapour transport (CF-PVT) growth technique. We focused on the heteropolytypic 6H-3C transition under silicon-rich gas phase for temperatures from 1800 to 2000 °C. Seed polarity effects were studied. The 3C proportion reached a maximum for a well-defined temperature which was higher on the C face than on the Si face. The 2D nucleation threshold for the 3C polytype was around 1825 °C on the Si face. 3C formation was closely connected to the surface morphology, i.e. to the development of facets (on-axis regions) on the Si face.

Dates et versions

hal-00188007 , version 1 (15-11-2007)

Identifiants

Citer

Laurence Latu-Romain, Didier Chaussende, Patrick Chaudouët, Florence Robaut, Gregory Berthomé, et al.. Study of 3C-SiC nucleation on (0 0 0 1) 6H-SiC nominal surfaces by the CF-PVT method. Journal of Crystal Growth, 2005, 275, pp.e609-e613. ⟨10.1016/j.jcrysgro.2004.11.005⟩. ⟨hal-00188007⟩

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