Soft-switching turn-off characterization at high temperature of 1200V trench IGBTusing local lifetime control - Archive ouverte HAL Accéder directement au contenu
Communication Dans Un Congrès Année : 2001

Soft-switching turn-off characterization at high temperature of 1200V trench IGBTusing local lifetime control

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hal-00185555 , version 1 (06-11-2007)

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  • HAL Id : hal-00185555 , version 1

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Stéphane Azzopardi, H. Iwamoto, A. Kawamura. Soft-switching turn-off characterization at high temperature of 1200V trench IGBTusing local lifetime control. Proc.IEEE International Symposium on Power Semiconductor Devices and Ics, 2001, Japon. pp.1. ⟨hal-00185555⟩
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