Conference Papers
Year : 1995
Ims Import : Connect in order to contact the contributor
https://hal.science/hal-00185421
Submitted on : Tuesday, November 6, 2007-9:05:32 AM
Last modification on : Friday, March 24, 2023-2:52:49 PM
Dates and versions
Identifiers
- HAL Id : hal-00185421 , version 1
Cite
Hervé Lapuyade, Pascal Fouillat, Yvan Maidon, Jean Tomas, Jean-Paul Dom. Design For Testability of Built-In Laser Sensitive Cells. Proc. of the 6th European Symposium Reliability of Electronic devices, Failure Physics and analysis, 1995, France. pp.1. ⟨hal-00185421⟩
Collections
29
View
0
Download