Implementation of Laser Beam Sensitive Cells : a new approach for integrated circuits testing - Archive ouverte HAL Access content directly
Journal Articles Quality and Reliability Engineering International Year : 1994
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hal-00185408 , version 1 (06-11-2007)

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  • HAL Id : hal-00185408 , version 1

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Pascal Fouillat, Stéphane Gervais-Ducouret, Hervé Lapuyade, Jean-Paul Dom. Implementation of Laser Beam Sensitive Cells : a new approach for integrated circuits testing. Quality and Reliability Engineering International, 1994, 10, pp.1. ⟨hal-00185408⟩
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