Journal Articles
Quality and Reliability Engineering International
Year : 1994
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https://hal.science/hal-00185408
Submitted on : Tuesday, November 6, 2007-9:05:26 AM
Last modification on : Friday, March 24, 2023-2:52:49 PM
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- HAL Id : hal-00185408 , version 1
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Pascal Fouillat, Stéphane Gervais-Ducouret, Hervé Lapuyade, Jean-Paul Dom. Implementation of Laser Beam Sensitive Cells : a new approach for integrated circuits testing. Quality and Reliability Engineering International, 1994, 10, pp.1. ⟨hal-00185408⟩
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